 |
Home
Classes
Phys 152 and 251
Phys 416
Scholarship
Magnetic Materials
A nontechnical view
My lab and facilities
Photo Gallery
Physics Education
Physics Education
Just-in-Time Teaching (JiTT)
Service
Professional and Community Service
Support
Grants and Contracts
Etc.
Curriculum Vitae
Return to: Physics Dept.
Return to: IUPUI
|
|
In my Lab (current or on order)
- Sputtering system
Base pressure= 5 X 10-9 Sources: four tilted, 2 vertical
Target diameter: 2 "
Magnets: SmCo5
rf and dc excitation
Quartz crystal thickness monitors
Computer controlled substrate and shutter motion
Two gas reactive sputtering
50 ton hydraulic press for composite target fabrication
- Vibrating Sample Magnetometer
Noise: 1 X 10-6 emu
Magnet: 9T Superconducting.
Temperature Range: 2-1000K
- Tube furnace
2" diameter
Hydrogen, argon, and oxygen atmospheres or vacuum
1000 °C
- Transport measurements
Measurements: 4 probe resistivity, magnetoresistance (3 geometries), Hall
effect
Probe one: Temperature control 77-300 K, maximum field 1.5 T
Probe two: Temperature control 4.2-300K, two samples
In the Physics Department at IUPUI
- NMR: 300, 500 MHz high resolution, pulsed spectrometers
- EPR: x band spectrometer
Around IUPUI
- Geology Department: X-ray diffractometer, electron
microprobe, ICP spectrometer
- Chemistry Department: Scanned probe microscopy (STM,
AFM)
- Medical and Dental Schools: High resolution TEM and SEM
Recent collaborators
- National Institure of Standards and Technology (NIST), Electron Physics Group:
High resolution scanning Auger microscopy (SAM), magnetic imaging by Scanning
electron microscopy with polarization analysis (SEMPA) and magnetic force
microscopy (MFM).
- The Johns Hopkins University, C. L. Chien, et al.
Squid and Vibrating sample Magnetometry, Laser ablation and sputtering deposition
systems, Mossbauer spectroscopy
- University of Nebraska, Lincoln. Sy-Hwang Liou, et al.
Atomic force microscopy (AFM) and Magnetic force microscopy (MFM)
|
